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Scanning Probe Microscopy and Spectroscopy – Theory Techniques and Applications 2e
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Scanning Probe Microscopy and Spectroscopy – Theory Techniques and Applications 2e : Theory, Techniques, and Applications

Book Details

Format Hardback or Cased Book
ISBN-10 047124824X
ISBN-13 9780471248248
Publisher John Wiley & Sons Inc
Imprint Wiley-VCH Publishers Inc.,U.S.
Country of Manufacture US
Country of Publication GB
Publication Date Jan 3rd, 2001
Print length 512 Pages
Weight 884 grams
Dimensions 16.30 x 24.40 x 3.40 cms
Product Classification: MicroscopyAnalytical chemistry
Ksh 43,550.00
Werezi Extended Catalogue 0 in stock

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Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science.
A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

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