Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Get Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Imperial College Press and it has pages.
