Secondary Ion Mass Spectroscopy of Solid Surfaces
Book Details
Format
Hardback or Cased Book
ISBN-10
9067640786
ISBN-13
9789067640787
Publisher
Brill
Imprint
VSP International Science Publishers
Country of Manufacture
NL
Country of Publication
GB
Publication Date
Dec 1st, 1987
Print length
138 Pages
Weight
362 grams
Product Classification:
Spectrum analysis, spectrochemistry, mass spectrometry
Ksh 25,200.00
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This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.
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