Stochastic Process Variation in Deep-Submicron CMOS : Circuits and Algorithms
Softcover reprint of the original 1st ed. 2014
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1 Introduction.
1.1 Stochastic Process Variations in Deep-Submicron CMOS. 1.2 Remarks on Current Design Practice. 1.3Motivation. 1.4 Organization of the Book.
2. Random Process Variation in Deep-Submicron CMOS.
2.1 Modeling Process Variability. 2.2 Stochastic MNA for Process Variability Analysis. 2.3 Statistical Timing Analysis. 2.4 Yield Constrained Energy Optimization. 2.5 Experimental Results. 2.6 Conclusions.
3 Electronic Noise in Deep-Submicron CMOS.
3.1 Stochastic MNA for Noise Analysis. 3.2 Accuracy Considerations. 3.3 Adaptive Numerical Integration Methods. 3.4 Estimation of the Noise Content Contribution. 3.5 Experimental Results. 3.6 Conclusions.
4 Thermal Effects in Deep-Submicron CMOS.
4.1 Thermal Model. 4.2 Temperature Estimation. 4.3 Reducing Computation Complexity. 4.4 System Level Methodology for Temperature Constrained Power Management. 4.5 Experimental Results. 4.6 Conclusions.
5 Circuit Solutions.
5.1 Architecture of the System. 5.2 Circuits for Active Monitoring of Temperature and Process Variations. 5.3 Characterization of Process Variability Conditions. 5.4 Experimental Results. 5.5 Conclusions.
6 Conclusions and Recommendations.
6.1 Summary of the Results. 6.2 Recommendations and Future Research.
Appendix. References. Acknowledgement. About the Author.
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