Surface and Thin Film Analysis : A Compendium of Principles, Instrumentation, and Applications
2nd, Completely Revised and Enlarged Edition
Book Details
Format
Hardback or Cased Book
ISBN-10
3527320474
ISBN-13
9783527320479
Edition
2nd, Completely Revised and Enlarged Edition
Publisher
Wiley-VCH Verlag GmbH
Imprint
Blackwell Verlag GmbH
Country of Manufacture
DE
Country of Publication
GB
Publication Date
Apr 20th, 2011
Print length
558 Pages
Weight
1,186 grams
Dimensions
18.20 x 24.80 x 3.10 cms
Product Classification:
Chemistry
Ksh 28,800.00
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Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)
Get Surface and Thin Film Analysis by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Wiley-VCH Verlag GmbH and it has pages.
