Surface and Thin Film Analysis : A Compendium of Principles, Instrumentation, and Applications
2nd, Completely Revised and Enlarged Edition
Book Details
Format
Hardback or Cased Book
ISBN-10
3527320474
ISBN-13
9783527320479
Edition
2nd, Completely Revised and Enlarged Edition
Publisher
Wiley-VCH Verlag GmbH
Imprint
Blackwell Verlag GmbH
Country of Manufacture
DE
Country of Publication
GB
Publication Date
Apr 20th, 2011
Print length
558 Pages
Weight
1,186 grams
Dimensions
18.20 x 24.80 x 3.10 cms
Product Classification:
Chemistry
Ksh 28,800.00
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Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.
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