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Surface and Thin Film Analysis : A Compendium of Principles, Instrumentation, and Applications - 2nd, Completely Revised and Enlarged Edition

By: (Edited by) Gernot Friedbacher , (Edited by) Henning Bubert

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Ksh 28,800.00

Format: Hardback or Cased Book

ISBN-10: 3527320474

ISBN-13: 9783527320479

Edition: 2nd, Completely Revised and Enlarged Edition

Publisher: Wiley-VCH Verlag GmbH

Imprint: Blackwell Verlag GmbH

Country of Manufacture: DE

Country of Publication: GB

Publication Date: Apr 20th, 2011

Print length: 558 Pages

Weight: 1,186 grams

Dimensions (height x width x thickness): 18.20 x 24.80 x 3.10 cms

Product Classification: Chemistry

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Completely revised and updated, this second edition of a bestseller surveys and compares all techniques relevant for practical applications. New chapters cover such recent methods as SNOM, SERS, and laser ablation. With over 500 references and a list of equipment suppliers.

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