Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Book Details
Format
Hardback or Cased Book
ISBN-10
9812778810
ISBN-13
9789812778819
Publisher
World Scientific Publishing Co Pte Ltd
Imprint
World Scientific Publishing Co Pte Ltd
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Apr 3rd, 2008
Print length
368 Pages
Weight
654 grams
Dimensions
23.70 x 16.20 x 2.00 cms
Product Classification:
Storage media & peripherals
Ksh 22,150.00
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Terrestrial neutron-induced soft errors of semiconductor memory devices are a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant topics in terrestrial neutron-induced soft errors.
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
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