Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
by
Eishi H. Ibe
Book Details
Format
Hardback or Cased Book
Book Series
IEEE Press
ISBN-10
1118479297
ISBN-13
9781118479292
Publisher
John Wiley & Sons Inc
Imprint
Wiley-IEEE Press
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Feb 13th, 2015
Print length
296 Pages
Weight
599 grams
Dimensions
24.90 x 17.50 x 2.00 cms
Product Classification:
Circuits & components
Ksh 21,750.00
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This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
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