Thermal-Aware Testing of Digital VLSI Circuits and Systems
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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level
Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques
This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
Get Thermal-Aware Testing of Digital VLSI Circuits and Systems by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has pages.
