Tolerance Analysis of Electronic Circuits Using MATLAB
by
Robert Boyd
Book Details
Format
Paperback / Softback
ISBN-10
0849322766
ISBN-13
9780849322761
Publisher
Taylor & Francis Inc
Imprint
CRC Press Inc
Country of Manufacture
US
Country of Publication
GB
Publication Date
Jun 8th, 1999
Print length
158 Pages
Weight
300 grams
Product Classification:
Testing of materialsCircuits & components
Ksh 9,550.00
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Written for the practicing electronics professional, this book offers a comprehensive, step-by-step treatment of methods used to perform analyses useful to the design process of circuit cards and systems of cards. It presents the mathematical procedures used to determine performance limits.
Written for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATLAB offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
worst-case analysis,
limits for production testing,
component stress analysis,
determining if a design meets specification limits, and
manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
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