Total–Reflection X–ray Fluorescence Analysis and Related Methods 2e
Book Details
Format
Hardback or Cased Book
ISBN-10
1118460278
ISBN-13
9781118460276
Publisher
John Wiley & Sons Inc
Imprint
John Wiley & Sons Inc
Country of Manufacture
US
Country of Publication
GB
Publication Date
Mar 20th, 2015
Print length
552 Pages
Weight
889 grams
Dimensions
24.40 x 16.30 x 3.40 cms
Product Classification:
Spectrum analysis, spectrochemistry, mass spectrometry
Ksh 21,600.00
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Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques.
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study
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