Transmission Electron Microscopy : Physics of Image Formation
Fifth Edition 2008
Book Details
Format
Paperback / Softback
Book Series
Springer Series in Optical Sciences
ISBN-10
144192308X
ISBN-13
9781441923080
Edition
Fifth Edition 2008
Publisher
Springer-Verlag New York Inc.
Imprint
Springer-Verlag New York Inc.
Country of Manufacture
US
Country of Publication
GB
Publication Date
Nov 19th, 2010
Print length
590 Pages
Weight
828 grams
Dimensions
23.20 x 15.70 x 3.20 cms
Ksh 28,450.00
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Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature.
Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron-Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.
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