X-Ray Scattering
Book Details
Format
Hardback or Cased Book
ISBN-10
161324326X
ISBN-13
9781613243268
Publisher
Nova Science Publishers Inc
Imprint
Nova Science Publishers Inc
Country of Manufacture
US
Country of Publication
GB
Publication Date
Jan 26th, 2012
Print length
247 Pages
Weight
626 grams
Dimensions
26.10 x 18.50 x 2.00 cms
Product Classification:
Materials scienceApplied optics
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X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits.
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