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Advanced Materials Characterization

By: South Africa) Kumar Ch Sateesh (University of Johannesburg (Author) , India) Singh M. Muralidhar (Madanapalle Institute of Technology & Science (Author) , INDIA) Krishna Ram (MADANAPALLE INSTITUTE OF TECHNOLOGY AND SCIENCE (Author)

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Ksh 24,000.00

Format: Hardback or Cased Book

ISBN-13: 9781032375106

Publisher: Taylor & Francis Ltd

Publication Date: May 4th, 2023

Weight: 346 grams

Dimension: 16.10 x 24.10 x 1.40 cms

Category: Spectrum analysis, spectrochemistry, mass spectrometry

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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

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