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Failure Mechanisms in Semiconductor Devices

By: E. Ajith (Texas Instruments Inc.) Amerasekera (Author) , Farid N. (University of Illinois at Urbana-Champaign) Najm (Author)

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Ksh 45,250.00

Format: Hardback or Cased Book

ISBN-13: 9780471954828

Publisher: John Wiley & Sons Inc

Publication Date: Jun 20th, 1997

Weight: 680 grams

Dimension: 23.30 x 15.60 x 2.50 cms

Category: Condensed matter physics

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In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed.

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