Fundam Atom Force Microsc (P1)
Book Details
Delivery Location
Delivery fee: Select location
The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.
Get Fundam Atom Force Microsc (P1) by Ronald G Reifenberger at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by World Scientific Publishing Co Pte Ltd and it has 342 pages.
Customers Who Bought This Also Bought
More by Ronald G Reifenberger
More in This Genre
Magnetoresponsive Soft Nanosystems
KSh 39,400.00
Nanotechnology in Functional Foods and Nutraceuticals
KSh 1,600.00
Nanotechnology in Functional Foods and Nutraceuticals
KSh 1,600.00
Nanotechnology in Pharmaceutical Aerosol Science and Pulmonary Delivery
KSh 35,800.00
High Performance Supercapacitors from Waste Materials
KSh 32,200.00
Nanocarriers
KSh 28,800.00