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Fundam Atom Force Microsc (P1)
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Fundam Atom Force Microsc (P1)

Book Details

Format Paperback / softback
ISBN-10 9814630357
ISBN-13 9789814630351
Publisher World Scientific Publishing Co Pte Ltd
Imprint World Scientific Publishing Co Pte Ltd
Country of Manufacture GB
Country of Publication GB
Publication Date Nov 12th, 2015
Print length 342 Pages
Weight 492 grams
Dimensions 15.50 x 22.90 x 1.90 cms
Product Classification: Nanotechnology
KSh 7,200.00
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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

 

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.


Get Fundam Atom Force Microsc (P1) by Ronald G Reifenberger at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by World Scientific Publishing Co Pte Ltd and it has 342 pages.

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