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In Situ Characterization of Thin Film Growth

By: The Netherlands) Koster Enschede MESA+ Institute for Nanotechnology,University of Twente Gertjan (Professor (Author) , The Netherlands) Rijnders Enschede University of Twente MESA+ Institute for Nanotechnology Guus (Professor (Author)

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Ksh 32,200.00

Format: Hardback or Cased Book

ISBN-13: 9781845699345

Publisher: Elsevier Science & Technology

Publication Date: Oct 5th, 2011

Weight: 580 grams

Dimension: 23.40 x 16.70 x 2.10 cms

Category: Semi-conductors & super-conductors

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Part one reviews electron diffraction techniques, including the methodology for taking observations and measurements. Part two covers photoemission techniques; the principles and instrumentation. Part three contains alternative in-situ characterisation techniques and the trend for combining different techniques.

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