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Ionizing Radiation Effects in MOS Devices and Circuits

By: T. P. (Yale University) Ma (Author) , New Mexico) Dressendorfer Albuquerque Paul V. (Sandia National Laboratories (Author)

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Ksh 66,500.00

Format: Hardback or Cased Book

ISBN-13: 9780471848936

Publisher: John Wiley & Sons Inc

Publication Date: Jun 7th, 1989

Weight: 962 grams

Dimension: 24.50 x 16.90 x 3.40 cms

Category: Circuits & components

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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits.

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