Search

Categories

    • categories-img Jacket, Women
    • categories-img Woolend Jacket
    • categories-img Western denim
    • categories-img Mini Dresss
    • categories-img Jacket, Women
    • categories-img Woolend Jacket
    • categories-img Western denim
    • categories-img Mini Dresss
    • categories-img Jacket, Women
    • categories-img Woolend Jacket
    • categories-img Western denim
    • categories-img Mini Dresss
    • categories-img Jacket, Women
    • categories-img Woolend Jacket
    • categories-img Western denim
    • categories-img Mini Dresss
    • categories-img Jacket, Women
    • categories-img Woolend Jacket
    • categories-img Western denim
    • categories-img Mini Dresss

Filter By Price

$
-
$

Dietary Needs

Top Rated Product

product-img product-img

Modern Chair

$165.00
product-img product-img

Plastic Chair

$165.00
product-img product-img

Design Rooms

$165.00

Brands

  • Wooden
  • Chair
  • Modern
  • Fabric
  • Shoulder
  • Winter
  • Accessories
  • Dress

Welcome and thank you for visiting us. For any query call us on 0799 626 359 or Email [email protected]

Shopping Cart

Africa largest book store

Sub Total:

Search for any Title

Reliability and Failure of Electronic Materials and Devices

By: USA (Retired)) Ohring NJ Hoboken Milton (Stevens Institute of Technology (Author) , Lucian (Siemens Healthcare Diagnostics (Retired)) Kasprzak (Author)

Out of stock

Ksh 0.00

Format: Hardback or Cased Book

ISBN-13: 9780120885749

Publisher: Elsevier Science Publishing Co Inc

Publication Date: Oct 23rd, 2014

Weight: 1224 grams

Dimension: 23.20 x 16.50 x 4.60 cms

Category: INDUSTRIAL CHEMISTRY & MANUFACTURING TECHNOLOGIES

Choose your Location

Shipping & Delivery

Door Delivery

Delivery fee

  • Description

  • Reviews

Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.

Get Reliability and Failure of Electronic Materials and Devices by Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) Ohring at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Elsevier Science Publishing Co Inc and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

Customer Reviews

Based on 0 reviews

Mind, Body, & Spirit