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Reliability and Failure of Electronic Materials and Devices

By: USA (Retired)) Ohring NJ Hoboken Milton (Stevens Institute of Technology (Author)

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Ksh 24,500.00

Format: Hardback or Cased Book

ISBN-13: 9780125249850

Publisher: Elsevier Science Publishing Co Inc

Publication Date: Jun 12th, 1998

Dimension: 22.90 x 15.10 x 109.00 cms

Category: INDUSTRIAL CHEMISTRY & MANUFACTURING TECHNOLOGIES

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Suitable as a reference work for reliability professionals or as a text for graduate students, this book introduces reliability literature of microelectronic and electronic-optional devices. It integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation.

Get Reliability and Failure of Electronic Materials and Devices by Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) Ohring at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Elsevier Science Publishing Co Inc and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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