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Semiconductor Interfaces: Formation and Properties

By: Guy LeLay (Author) , Jacques Derrien (Author) , Nino Boccara (Author)

1 in stock

Ksh 19,800.00

Format: Paperback or Softback

ISBN-13: 9783642729690

Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Publication Date: Dec 6th, 2011

Weight: 662 grams

Dimension: 24.50 x 17.30 x 2.10 cms

Category: Condensed matter physics

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(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.

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