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VLSI Design and Test
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VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

1st ed. 2022

Book Details

Format Paperback / Softback
ISBN-10 3031215133
ISBN-13 9783031215131
Edition 1st ed. 2022
Publisher Springer International Publishing AG
Imprint Springer International Publishing AG
Country of Manufacture GB
Country of Publication GB
Publication Date Dec 17th, 2022
Print length 596 Pages
Product Classification: Circuits & componentsComputer hardware
Ksh 16,200.00
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This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022. The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions.
This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.


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