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VLSI Test Principles and Architectures

By: USA) Wang CA Sunnyvale Inc. Laung-Terng (SynTest Technologies (Author) , Taiwan.) Wu Hsinchu Cheng-Wen (National Tsing Hua University (Author) , Japan.) Wen Fukuoka Xiaoqing (Kyushu Institute of Technology (Author)

Extended Catalogue

Ksh 12,550.00

Format: Hardback or Cased Book

ISBN-13: 9780123705976

Publisher: Elsevier Science & Technology

Publication Date: Aug 14th, 2006

Weight: 1806 grams

Dimension: 24.10 x 20.00 x 5.10 cms

Category: Circuits & components

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A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.

Get VLSI Test Principles and Architectures by Laung-Terng (SynTest Technologies, Inc., Sunnyvale, CA, USA) Wang at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Elsevier Science & Technology and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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